Sirius Advanced Cybernetics –Machine Vision for Industry

Planarity Inspection

With the planarity control, the flatness of components can be controlled and guaranteed. This plays a crucial role for instance in the production of speedometer dials or solar wafers.

Our solutions are characterized by high accuracy – our SAC Pulsar technology, for instance, provides solutions in which we realize measurement resolutions in the range of few micrometers for objects with a footprint of about 100x100 mm. This is possible at an image acquisition time of only 300 to 500 milliseconds - without any moving axis.